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The Focused Ion Beam machine uses gallium
ions to shave-off 10 nm-thick (or more) layers of a rock sample (on
top of a holder in the lower-left corner), while preserving the fines
details of pore walls. Each freshly exposed rock surface is then
imaged with EM or the same ions. When 100 or more rock surface
images are acquired, the rock's pore space is reconstructed in
3D. The FIB method is the only means of
imaging fine-grained rock: chalk, shale, diatomite, etc. |